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contributor authorMorzfeld, Matthias
date accessioned2017-05-09T01:16:28Z
date available2017-05-09T01:16:28Z
date issued2015
identifier issn0022-0434
identifier otherds_137_05_051016.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/157524
description abstractImplicit sampling is a recently developed variationally enhanced sampling method that guides its samples to regions of high probability, so that each sample carries information. Implicit sampling may thus improve the performance of algorithms that rely on Monte Carlo (MC) methods. Here the applicability and usefulness of implicit sampling for improving the performance of MC methods in estimation and control is explored, and implicit sampling based algorithms for stochastic optimal control, stochastic localization, and simultaneous localization and mapping (SLAM) are presented. The algorithms are tested in numerical experiments where it is found that fewer samples are required if implicit sampling is used, and that the overall runtimes of the algorithms are reduced.
publisherThe American Society of Mechanical Engineers (ASME)
titleImplicit Sampling for Path Integral Control, Monte Carlo Localization, and SLAM
typeJournal Paper
journal volume137
journal issue5
journal titleJournal of Dynamic Systems, Measurement, and Control
identifier doi10.1115/1.4029064
journal fristpage51016
journal lastpage51016
identifier eissn1528-9028
treeJournal of Dynamic Systems, Measurement, and Control:;2015:;volume( 137 ):;issue: 005
contenttypeFulltext


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