| contributor author | Sasagawa, Kazuhiko | |
| contributor author | Fujisaki, Kazuhiro | |
| contributor author | Unuma, Jun | |
| contributor author | Azuma, Ryota | |
| date accessioned | 2017-05-09T01:06:55Z | |
| date available | 2017-05-09T01:06:55Z | |
| date issued | 2014 | |
| identifier issn | 1528-9044 | |
| identifier other | ep_136_04_041011.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/154505 | |
| description abstract | The damage mechanisms of carbon nanotubes are considered to be the oxidation by Joule heating and migration of carbon atoms by highdensity electron flows. In this study, a high current density testing system was designed and applied to multiwalled carbon nanotubes (MWCNTs) collected at the gap between thinfilm electrodes. Local evaporation of carbon atoms occurred on the cathode side of the MWCNTs under relatively low current density conditions, and the center area of the MWCNTs under high current density conditions. The damaged morphology could be explained by considering both Joule heating and electromigration behavior of MWCNTs. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Experimental Study of Damage Mechanism of Carbon Nanotube as Nanocomponent of Electronic Devices Under High Current Density | |
| type | Journal Paper | |
| journal volume | 136 | |
| journal issue | 4 | |
| journal title | Journal of Electronic Packaging | |
| identifier doi | 10.1115/1.4026878 | |
| journal fristpage | 41011 | |
| journal lastpage | 41011 | |
| identifier eissn | 1043-7398 | |
| tree | Journal of Electronic Packaging:;2014:;volume( 136 ):;issue: 004 | |
| contenttype | Fulltext | |