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    Multistack Close Range Photogrammetry for Low Cost Submillimeter Metrology

    Source: Journal of Computing and Information Science in Engineering:;2013:;volume( 013 ):;issue: 004::page 44501
    Author:
    Galantucci, L. M.
    ,
    Lavecchia, F.
    ,
    Percoco, G.
    DOI: 10.1115/1.4024973
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Considerable research effort has been focused on evaluating the accuracy of mesoand macroscale digital close range photogrammetry. However, evaluations of accuracy and applications in the submillimeter scale are rare. In this paper the authors propose the development of a threedimensional (3D) photogrammetric scanner, based on macrolens cameras, able to reconstruct the threedimensional surface topography of objects with submillimeter features. The system exploits multifocal image composition and has been designed for installation on all types of Numerical Controlled or Robotic systems. The approach is exploitable for digitizing submillimeter features at mesoscale as well as macroscale objects.
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      Multistack Close Range Photogrammetry for Low Cost Submillimeter Metrology

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    https://yetl.yabesh.ir/yetl1/handle/yetl/151248
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    contributor authorGalantucci, L. M.
    contributor authorLavecchia, F.
    contributor authorPercoco, G.
    date accessioned2017-05-09T00:57:14Z
    date available2017-05-09T00:57:14Z
    date issued2013
    identifier issn1530-9827
    identifier otherjcise_013_04_044501.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/151248
    description abstractConsiderable research effort has been focused on evaluating the accuracy of mesoand macroscale digital close range photogrammetry. However, evaluations of accuracy and applications in the submillimeter scale are rare. In this paper the authors propose the development of a threedimensional (3D) photogrammetric scanner, based on macrolens cameras, able to reconstruct the threedimensional surface topography of objects with submillimeter features. The system exploits multifocal image composition and has been designed for installation on all types of Numerical Controlled or Robotic systems. The approach is exploitable for digitizing submillimeter features at mesoscale as well as macroscale objects.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleMultistack Close Range Photogrammetry for Low Cost Submillimeter Metrology
    typeJournal Paper
    journal volume13
    journal issue4
    journal titleJournal of Computing and Information Science in Engineering
    identifier doi10.1115/1.4024973
    journal fristpage44501
    journal lastpage44501
    identifier eissn1530-9827
    treeJournal of Computing and Information Science in Engineering:;2013:;volume( 013 ):;issue: 004
    contenttypeFulltext
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian
     
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian