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    Plastic Yield Conditions for Adhesive Contacts Between a Rigid Sphere and an Elastic Half-Space

    Source: Journal of Tribology:;2009:;volume( 131 ):;issue: 001::page 11403
    Author:
    Yu-Chiao Wu
    ,
    George G. Adams
    DOI: 10.1115/1.3002329
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Hertz contact theory allows the onset of yielding to be predicted for those contacts in which the effect of adhesion can be neglected. However, in microscale contacts, such as those that occur in microelectromechanical systems (MEMS), yielding will occur for lower loads than those predicted by Hertz. For such cases, the Johnson–Kendall–Roberts (JKR), Derjaguin–Muller–Toporov (DMT), and Greenwood–Johnson (GJ) theories extend the Hertz theory to include the effect of adhesion. The present study gives yield conditions for the JKR, DMT, and Greenwood–Johnson theories of adhesion. Attention is first focused on the initiation of yield along the axis of symmetry of an elastic half-space contacted by a rigid sphere. The results show that the critical loads for the three adhesion theories are close together, but differ significantly from that predicted by Hertz. In fact, it is possible for yielding to occur due to adhesion alone, without an external load. A curve-fit formula is given for the yield load as a function of an adhesion parameter for different Poisson’s ratios. Results are then obtained for the onset of plastic deformation away from the axis of symmetry using the Greenwood–Johnson theory of adhesion.
    keyword(s): Adhesives , Stress , Elastic half space AND Deformation ,
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      Plastic Yield Conditions for Adhesive Contacts Between a Rigid Sphere and an Elastic Half-Space

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    https://yetl.yabesh.ir/yetl1/handle/yetl/142108
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    contributor authorYu-Chiao Wu
    contributor authorGeorge G. Adams
    date accessioned2017-05-09T00:35:41Z
    date available2017-05-09T00:35:41Z
    date copyrightJanuary, 2009
    date issued2009
    identifier issn0742-4787
    identifier otherJOTRE9-28763#011403_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/142108
    description abstractHertz contact theory allows the onset of yielding to be predicted for those contacts in which the effect of adhesion can be neglected. However, in microscale contacts, such as those that occur in microelectromechanical systems (MEMS), yielding will occur for lower loads than those predicted by Hertz. For such cases, the Johnson–Kendall–Roberts (JKR), Derjaguin–Muller–Toporov (DMT), and Greenwood–Johnson (GJ) theories extend the Hertz theory to include the effect of adhesion. The present study gives yield conditions for the JKR, DMT, and Greenwood–Johnson theories of adhesion. Attention is first focused on the initiation of yield along the axis of symmetry of an elastic half-space contacted by a rigid sphere. The results show that the critical loads for the three adhesion theories are close together, but differ significantly from that predicted by Hertz. In fact, it is possible for yielding to occur due to adhesion alone, without an external load. A curve-fit formula is given for the yield load as a function of an adhesion parameter for different Poisson’s ratios. Results are then obtained for the onset of plastic deformation away from the axis of symmetry using the Greenwood–Johnson theory of adhesion.
    publisherThe American Society of Mechanical Engineers (ASME)
    titlePlastic Yield Conditions for Adhesive Contacts Between a Rigid Sphere and an Elastic Half-Space
    typeJournal Paper
    journal volume131
    journal issue1
    journal titleJournal of Tribology
    identifier doi10.1115/1.3002329
    journal fristpage11403
    identifier eissn1528-8897
    keywordsAdhesives
    keywordsStress
    keywordsElastic half space AND Deformation
    treeJournal of Tribology:;2009:;volume( 131 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian