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    A Deterministic-Chaos Study of Electron Triboemission Outputs

    Source: Journal of Tribology:;2007:;volume( 129 ):;issue: 003::page 679
    Author:
    G. J. Molina
    ,
    M. J. Furey
    ,
    C. Kajdas
    DOI: 10.1115/1.2736709
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The authors have carried out extensive measurements of electron triboemission from the scratching of ceramics and semiconductors that are briefly summarized in this paper. Analysis of the frequency-domain distribution of typical triboemission count-pulse outputs suggested that their occurrence is not Poisson’s (e.g., it is not random). This paper presents a study on the hypothesis of deterministic-chaos origin for triboemission data. Electron triboemission outputs from the ceramics alumina, sapphire, silicon nitride, and the semiconductors Si and Ge are analyzed by means of extracting deterministic-chaos metrics. The results suggest that the low-level electron-emission components may be described by multiplicative processes of random initiation, while the superimposed large burst-type components may be of deterministic origin.
    keyword(s): Triboemission , Semiconductors (Materials) , Chaos theory AND Diamonds ,
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      A Deterministic-Chaos Study of Electron Triboemission Outputs

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    https://yetl.yabesh.ir/yetl1/handle/yetl/136915
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    contributor authorG. J. Molina
    contributor authorM. J. Furey
    contributor authorC. Kajdas
    date accessioned2017-05-09T00:25:55Z
    date available2017-05-09T00:25:55Z
    date copyrightJuly, 2007
    date issued2007
    identifier issn0742-4787
    identifier otherJOTRE9-28751#679_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/136915
    description abstractThe authors have carried out extensive measurements of electron triboemission from the scratching of ceramics and semiconductors that are briefly summarized in this paper. Analysis of the frequency-domain distribution of typical triboemission count-pulse outputs suggested that their occurrence is not Poisson’s (e.g., it is not random). This paper presents a study on the hypothesis of deterministic-chaos origin for triboemission data. Electron triboemission outputs from the ceramics alumina, sapphire, silicon nitride, and the semiconductors Si and Ge are analyzed by means of extracting deterministic-chaos metrics. The results suggest that the low-level electron-emission components may be described by multiplicative processes of random initiation, while the superimposed large burst-type components may be of deterministic origin.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleA Deterministic-Chaos Study of Electron Triboemission Outputs
    typeJournal Paper
    journal volume129
    journal issue3
    journal titleJournal of Tribology
    identifier doi10.1115/1.2736709
    journal fristpage679
    journal lastpage683
    identifier eissn1528-8897
    keywordsTriboemission
    keywordsSemiconductors (Materials)
    keywordsChaos theory AND Diamonds
    treeJournal of Tribology:;2007:;volume( 129 ):;issue: 003
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
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