Special Issue on Reverse Engineering and Computational Metrology: Part 2—Computational Metrology Strategies and Methods

Abstract

Computational metrology has recently begun to play a prominent role in the evolution of engineering systems and the improvement of production technologies. Indeed, this field has become essential due to the use of advanced inspection technologies in manufacturing industries. These technologies, primarily emerging scanning technologies such as coordinate measuring machines (CMMs), laser scanners, and three-dimensional cameras, have led to rising industrial demands for digital geometric processing (DGP) of sampled data. In response, new methodologies have been developed to cope with the complex metrology problems of data fusion, surface reconstruction, feature verification, and handling tolerances of sampled data. These computational metrology methods are used mainly for design, manufacturing, inspection, and quality control applications.