| contributor author | H. Krishnamoorthy | |
| contributor author | H. V. Tippur | |
| date accessioned | 2017-05-08T23:56:15Z | |
| date available | 2017-05-08T23:56:15Z | |
| date copyright | September, 1998 | |
| date issued | 1998 | |
| identifier issn | 1528-9044 | |
| identifier other | JEPAE4-26167#267_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/120249 | |
| description abstract | An experimental investigation dealing with failure characterization of 63/37 solder-copper interfaces is presented. The method of moiré interferometry is used for mapping elasto-plastic deformations in bimaterials subjected to predominantly tensile loading. A method for quantifying the fracture parameter—the J-integral—using full-field measurement of crack opening displacements has been developed. A linear relationship between crack tip opening displacements (CTOD) and the J-integral is demonstrated. The crack growth resistance curve and hence crack initiation toughness Jc value for the bimaterial is obtained. Full-field optical information has also suggested the possibility of using a simpler method for the J-integral estimation using a single strain gage for fracture testing of interfaces with large mismatch in this geometry. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Evaluation of Elasto-Plastic Interfacial Fracture Parameters in Solder-Copper Bimaterial Using Moiré Interferometry | |
| type | Journal Paper | |
| journal volume | 120 | |
| journal issue | 3 | |
| journal title | Journal of Electronic Packaging | |
| identifier doi | 10.1115/1.2792632 | |
| journal fristpage | 267 | |
| journal lastpage | 274 | |
| identifier eissn | 1043-7398 | |
| keywords | Copper | |
| keywords | Interferometry | |
| keywords | Solders | |
| keywords | Fracture (Process) | |
| keywords | Testing | |
| keywords | Failure | |
| keywords | Geometry | |
| keywords | Strain gages | |
| keywords | Toughness | |
| keywords | Electrical resistance AND Deformation | |
| tree | Journal of Electronic Packaging:;1998:;volume( 120 ):;issue: 003 | |
| contenttype | Fulltext | |