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    Design of a Static TIM Tester 

    Source: Journal of Electronic Packaging:;2010:;volume( 132 ):;issue: 001:;page 11001
    Author(s): V. Székely; E. Kollár; G. Somlay; P. G. Szabó; M. Rencz
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Testing the thermal properties of thermal interface material (TIM) has been a big challenge for decades. Recent development trends made this challenge even bigger, as now the values that have ...
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    A Scalable Multi-Functional Thermal Test Chip Family: Design and Evaluation 

    Source: Journal of Electronic Packaging:;2001:;volume( 123 ):;issue: 004:;page 323
    Author(s): Zs. Benedek; B. Courtois; G. Farkas; E. Kollár; S. Mir; A. Poppe; V. Székely; K. Torki; M. Rencz
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Nowadays, thermal characterization of IC packages and packaging technologies is becoming a key task in thermal engineering. To support this by measurements, we developed a family of thermal test ...
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