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    Experimental Study of Damage Mechanism of Carbon Nanotube as Nanocomponent of Electronic Devices Under High Current Density 

    Source: Journal of Electronic Packaging:;2014:;volume( 136 ):;issue: 004:;page 41011
    Author(s): Sasagawa, Kazuhiko; Fujisaki, Kazuhiro; Unuma, Jun; Azuma, Ryota
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The damage mechanisms of carbon nanotubes are considered to be the oxidation by Joule heating and migration of carbon atoms by highdensity electron flows. In this study, a high current density testing system was designed ...
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