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dc.contributor.authorLee, Cheol W.
dc.contributor.authorJeong, Jihyuk
dc.date.accessioned2026-08-23T08:32:40Z
dc.date.available2026-08-23T08:32:40Z
dc.date.copyright2026/01/01
dc.date.issued2026
dc.identifier.issn0022-0434
dc.identifier.otherds-25-1192.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4316706
dc.description.abstractAbstract. The Krylov subspace method is an efficient projection-based approach for reduced-order modeling (ROM) of large-scale linear systems common in computational fluid dynamics (CFD). It works by matching moments between a full-order model (FOM) and its ROM counterpart at specific interpolation points or shifts. However, its adoption is hindered by the need for high-dimensional operators from the CFD model. Recently, several methods have emerged to bypass this requirement for diffusive and convective transport problems. This paper interprets such attempts as a new branch of ROM techniques based on alter-and-excite (A&E) for improved identification, in contrast with traditional system-identification techniques relying solely on excitation for extraction of system information. In an A&E approach, the CFD model is iteratively both altered and excited to identify Krylov subspace basis vectors directly from system responses. Additionally, a novel A&E method is proposed for generating the Krylov subspace with complex conjugate shifts. It is shown that reformulating the CFD model as a multiphysics problem provides the necessary information for constructing a ROM based on real matrices when complex shifts are adopted. The study details the implementation and evaluation of the A&E method with complex conjugate shifts.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleAlter-and-Excite Approach for Reduced-Order Modeling of Diffusive and Convective Transport Phenomena
dc.typeJournal Paper
dc.journal.volume148
dc.journal.issue1
dc.journal.titleJournal of Dynamic Systems, Measurement, and Control
dc.identifier.doi10.1115/1.4069537
dc.treeJournal of Dynamic Systems, Measurement, and Control:;2026:;volume( 148 ):;issue:001
dc.contenttypeFulltext


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