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dc.contributor.authorCruz-Alonso, Ángel
dc.contributor.authorTerroba, Félix
dc.contributor.authorCuesta-Infante, Alfredo
dc.date.accessioned2026-08-23T07:54:33Z
dc.date.available2026-08-23T07:54:33Z
dc.date.copyright2026/04/01
dc.date.issued2026
dc.identifier.issn1530-9827
dc.identifier.otherjcise-25-1392.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4315785
dc.description.abstractAbstract. Thin-walled structures are ubiquitous in industries such as automotive, civil engineering, consumer electronics, or medical devices; and many times these structures, or a significant part of them, can be approximated by a plate as in aerospace and shipbuilding. In order to prevent damages and increase safety, “on-condition” maintenance is increasingly being used due to the nowadays ability to continuously sensing and processing data in real time. A key feature to assess the probability of damage is the strain caused by loads. In this article, our goal is to estimate the strain in the whole structure based on measurements that only capture a 1.2% of its total surface. We show that the problem is equivalent to reconstructing an image with 98.8% missing pixels and present a novel procedure referred to as the recurrent inpainting model (RIM). We use finite element methods to simulate a thin-walled structure under different loads and create a large data set of instances. Then, we use RIM to carry out the reconstruction task along with tests of robustness against sensor failure, transferability to other sensor morphologies, and generalization to 3D hollow structures. The results in all the tasks clearly outrank the next best deep learning architecture.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleFull Strain Matrix Estimation in Thin-Walled Structures With Recurrent Inpainting Model
dc.typeJournal Paper
dc.journal.volume26
dc.journal.issue4
dc.journal.titleJournal of Computing and Information Science in Engineering
dc.identifier.doi10.1115/1.4071388
dc.journal.fristpage1848
dc.journal.lastpage1859
dc.page12
dc.treeJournal of Computing and Information Science in Engineering:;2026:;volume( 026 ):;issue:004
dc.contenttypeFulltext


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