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dc.contributor.authorVinod, Ghanashyam
dc.contributor.authorReddy Yanamala, Rama Muni
dc.contributor.authorAmar Raj, Rayappa David
dc.contributor.authorT, Subeesh
dc.contributor.authorV, Anandkumar
dc.contributor.authorNazari, Rouzbeh
dc.contributor.authorV, Manasa
dc.contributor.authorPallakonda, Archana
dc.date.accessioned2026-08-23T07:54:27Z
dc.date.available2026-08-23T07:54:27Z
dc.date.copyright2026/04/01
dc.date.issued2026
dc.identifier.issn1530-9827
dc.identifier.otherjcise-25-1094.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4315782
dc.description.abstractAbstract. Modern deep neural network models can achieve high accuracy for computer vision tasks; however, their high computational cost keeps them ashore from deployment on embedded devices. To resolve this, MobileNet was introduced. MobileNet is a lightweight convolutional neural network (CNN) architecture that adopts depthwise separable convolution over the standard convolution to reduce the number of operations and parameters without much loss in accuracy. This article presents the design and implementation of four reusable computing engines for depthwise convolution, pointwise convolution, standard convolution, and batch normalization layers. These engines are designed for low-latency defect classification in solar cells on embedded devices. Our MobileNet model achieved an accuracy of 91% (2 classes), 86% (8 classes), 79% (11 classes), and 86% (12 classes) in classification. Intellectual property (IP) blocks also acquired an optimum execution time of 0.07 ms for pointwise IP, 0.02 ms for convolution IP, 0.13 ms for depthwise IP, and 0.07 ms for batch normalization when deployed on ZYNQ-ZCU104 board.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleFPGA-Powered Solar Photovoltaic Module Defect Classification: Patch-Wise Reusable Convolutional Neural Network Intellectual Properties for High-Speed Edge Processing
dc.typeJournal Paper
dc.journal.volume26
dc.journal.issue4
dc.journal.titleJournal of Computing and Information Science in Engineering
dc.identifier.doi10.1115/1.4070331
dc.treeJournal of Computing and Information Science in Engineering:;2026:;volume( 026 ):;issue:004
dc.contenttypeFulltext


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