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dc.contributor.authorHo, Ching-Yuan
dc.contributor.authorLee, Haw-Teng
dc.date.accessioned2026-02-17T21:35:28Z
dc.date.available2026-02-17T21:35:28Z
dc.date.copyright5/12/2025 12:00:00 AM
dc.date.issued2025
dc.identifier.issn1043-7398
dc.identifier.otherep_147_03_031004.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4310324
dc.description.abstractThe microstructure transformation, mechanical properties, and fracture behavior of boron (B) decorated tin (Sn)-1.5%Ag-0.7%copper (Cu) (SAC157) solder joints with Cu pillars were analyzed. Three concentrations of B (0.015%, 0.020%, and 0.025%) were evenly mixed into the SAC157 solders. The addition of B refined the primary β-Sn phase and transformed the eutectic phase Ag3Sn from a plate-like structure to a dense stripe configuration. During high-temperature storage, coarse intermetallic compounds (IMCs) that extruded into the primary β-Sn in SAC157 solder were observed, and the growth of IMCs was inhibited by B-pinning boundary motion. Furthermore, the B additive simultaneously increased hardness and improved ductility by reducing grain size. In shear strength tests, the SAC157 solder exhibited a brittle fracture surface with a shorter displacement of 0.78 mm, compared to 1.2 mm of elongation in B-decorated SAC157 solders, which displayed ductile properties characterized by a dimpled fracture surface. In conclusion, B particles acted as heterogeneous nucleation sites, effectively refining the grain structure, inhibiting the growth of the eutectic phase, and simultaneously enhancing ductility without compromising hardness.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleEvaluation of Phase Transformation on Boron Decorated Sn-1.5Ag-0.7 Cu Joined Cu Pillar for Packaging Connection
dc.typeJournal Paper
dc.journal.volume147
dc.journal.issue3
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4068448
dc.journal.fristpage31004-1
dc.journal.lastpage31004-7
dc.page7
dc.treeJournal of Electronic Packaging:;2025:;volume( 147 ):;issue: 003
dc.contenttypeFulltext


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