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dc.contributor.authorVan Bossuyt, Douglas L.
dc.contributor.authorAllaire, Douglas
dc.contributor.authorBickford, Jason F.
dc.contributor.authorBozada, Thomas A.
dc.contributor.authorChen, Wei (Wayne)
dc.contributor.authorCutitta, Roger P.
dc.contributor.authorCuzner, Robert
dc.contributor.authorFletcher, Kristen
dc.contributor.authorGiachetti, Ronald
dc.contributor.authorHale, Britta
dc.contributor.authorHuang, H. Howie
dc.contributor.authorKeidar, Michael
dc.contributor.authorLayton, Astrid
dc.contributor.authorLedford, Allison|
dc.date.accessioned2025-08-20T09:41:02Z
dc.date.available2025-08-20T09:41:02Z
dc.date.copyright4/16/2025 12:00:00 AM
dc.date.issued2025
dc.identifier.issn1530-9827
dc.identifier.otherjcise-24-1514.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4308678
dc.description.abstractWhile digital twin (DT) has made significant strides in recent years, much work remains to be done in the research community and in the industry to fully realize the benefits of DT. A group of 25 industry professionals, US federal government researchers, and academics came together from 11 different institutions and organizations to identify 14 key thrusts and 3 cross-cutting areas for further DT research and development (R&D). This article presents our vision for the future of DT R&D, provides historical context for DT’s birth and growth as a field, provides examples of DTs in use in industry and the lab, and discusses the current state of DT research. We hope that this article serves as a nucleation point for future R&D efforts and provides the community with shared vision and trajectory to collectively advance DT so that society can more rapidly see the benefits of DT.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleThe Future of Digital Twin Research and Development
dc.typeJournal Paper
dc.journal.volume25
dc.journal.issue8
dc.journal.titleJournal of Computing and Information Science in Engineering
dc.identifier.doi10.1115/1.4068082
dc.journal.fristpage80801-1
dc.journal.lastpage80801-34
dc.page34
dc.treeJournal of Computing and Information Science in Engineering:;2025:;volume( 025 ):;issue: 008
dc.contenttypeFulltext


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