A Novel Probe Based on Photoconductive Effect for Non-Destructive Testing

Abstract

This research is primarily motivated by the demand for a convenient and economical nondestructive testing solution in industrial scenarios. We present a novel nondestructive testing probe, which is ingeniously designed with a photoresistor sensor and an illuminated light board, possessing remarkable features such as outstanding portability, minimal power consumption, and low cost. The experimental evaluation of the probe involves a line-scanning process above the crack position of an aluminum plate. As a result, an output signal in the form of variable resistance values of the photoresistor sensor is obtained. Notably, distinct peaks emerge in the output signal precisely when the probe traverses defects. These peaks serve as a crucial indicator for detecting surface defects of aluminum plates. Moreover, the varying amplitudes of the peaks in the output signal offer a reliable means to discriminate between defects of different depths. This probe holds significant potential for application in the quality assurance of aluminum manufacturing, as well as in the routine inspection of metallic structures, facilitating enhanced safety and reliability in engineering applications.