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    Design and Optimization of Heat Dissipation for a High-Voltage Control Box in Energy Storage Systems

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    tsea_16_8_081002.pdf (1.410Mb)
    Date
    2024
    Author
    Zhang, Jiajing
    Li, Hongqing
    Chen, Yun
    Jiang, Bingyun
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    Abstract
    To address the issue of excessive temperature rises within the field of electronic device cooling, this study adopts a multi-parameter optimization method. The primary objective is to explore and realize the design optimization of the shell structure of the high-voltage control box, aiming to effectively mitigate the temperature rise in internal components and enhance their thermal management efficacy without altering the fan performance, environmental conditions, or spatial layout. Initially, the study employs computational fluid dynamics methods to investigate the heat dissipation characteristics of the high-voltage control box, subsequently verifying the simulation parameters' accuracy through temperature rise tests. Building upon this foundation, the article conducts a thorough analysis of how the position and shape of the box's openings impact the device's temperature rise. The findings suggest that configuring circular openings on the front and rear sides can optimize the heat dissipation effect. Moreover, the SHERPA algorithm was employed to refine the size and distribution of the openings on the outer shell of the high-voltage control box through multi-parameter optimization, yielding locally optimal structural parameters. Post-optimization, the temperature measurement points within the high-voltage control box exhibited a maximum reduction in temperature rise of 27.16%. The pivotal contribution of this methodology is the application of a data-driven decision-making process for the enhancement of conventional heat dissipation designs. This research offers invaluable practical insights and novel perspectives on the optimization of thermal management designs for box-type electronic devices, significantly advancing the field of thermal management technology in electronic devices.
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    http://yetl.yabesh.ir/yetl1/handle/yetl/4302603
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