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dc.contributor.authorDöring, Ralf
dc.contributor.authorDudek, R.
dc.contributor.authorRzepka, S.
dc.contributor.authorScheiter, L.
dc.contributor.authorNoack, E.
dc.contributor.authorSeiler, B.
dc.date.accessioned2023-08-16T18:14:47Z
dc.date.available2023-08-16T18:14:47Z
dc.date.copyright12/23/2022 12:00:00 AM
dc.date.issued2022
dc.identifier.issn1043-7398
dc.identifier.otherep_145_01_011107.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4291698
dc.description.abstractA methodology is presented that allows the evaluation of the thermomechanical reliability of electronic packages using “virtual prototyping.” Here, a virtual flip chip ball grid array (FC-BGA) is examined in comparison to a reference chip scale package (CSP). The comparison is performed using finite element simulation. A combined measurement-simulation technique is used to calibrate the finite element simulations on a reference object. The adjustment is based on the in-plane deformation field obtained by both simulation and optical measurement. For the latter, an optical sensor is used for in-plane deformation and strain field analysis based on the gray-scale correlation method. The findings obtained can be extrapolated to alternative package types with different but similar design to evaluate their suitability for the desired application before physical fabrication.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleDesign Optimization by Virtual Prototyping Using Numerical Simulation to Ensure Thermomechanical Reliability in the Assembly and Interconnection of Electronic Assemblies
dc.typeJournal Paper
dc.journal.volume145
dc.journal.issue1
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4056445
dc.journal.fristpage11107-1
dc.journal.lastpage11107-6
dc.page6
dc.treeJournal of Electronic Packaging:;2022:;volume( 145 ):;issue: 001
dc.contenttypeFulltext


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