• Login
    View Item 
    •   DSpace Home
    • ASME
    • Journal of Electronic Packaging
    • View Item
    •   DSpace Home
    • ASME
    • Journal of Electronic Packaging
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    High Strain Rate Mechanical Properties of SAC-Q Solder for Extreme Temperatures After Exposure to Isothermal Aging Up to 90 Days

    Thumbnail
    View/Open
    ep_144_02_021108.pdf (8.128Mb)
    Date
    2021
    Author
    Lall, Pradeep
    Mehta, Vishal
    Suhling, Jeff
    Blecker, Ken
    Metadata
    Show full item record
    Abstract
    Electronic components are subject to high strain, during shock and vibration in many applications such as the automobile and aerospace. In many cases, this kind of electronic components will also be exposed to harsh temperatures of –65 °C to 200 °C. Electronic devices in harsh environments are often subject to strain rates of 1–100 per second. A large number of doped SAC solder alloys have emerged including SAC-Q, SAC-R, Innolot for electronic component interconnection. SAC-Q consists of inclusion of the Bi composition in Sn–Ag–Cu. For maximizing electronic package stability and high temperature storage and strain rates, the mechanical characteristic results and data for lead-free solder alloys are extremely significant. Thermal aging has been previously shown to cause modification of the mechanical properties at low strain rates. High strain-rate SAC-Q solder alloy data are not available for high temperature aging and testing at very low to high operating temperatures. For this analysis, the SAC-Q solder material was measured and analyzed at operating temperatures between –65 °C and 200 °C, at strain rates of up to 75 per second. Comparison with solder material SAC305, which has been tested under similar conditions, has also been made. When tensile experiments were carried out at various working temperatures, specimens for isothermal aging were preserved at 100 °C for up to 90 days after production and reflowing. The stress–strain curves are developed and described in this paper for a wide range of strain rates and test temperatures. Furthermore, the test results and data measured have been matched to the Anand viscoplasticity model and Anand constants have been determined by estimation of the high strain rate behavior measured in the broad range of working temperatures and stress levels.
    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/4284724
    Collections
    • Journal of Electronic Packaging

    DSpace software copyright © 2002-2015  DuraSpace
    Contact Us | Send Feedback
    Theme by 
    @mire NV
     

     

    Browse

    All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    LoginRegister

    Statistics

    View Usage Statistics

    DSpace software copyright © 2002-2015  DuraSpace
    Contact Us | Send Feedback
    Theme by 
    @mire NV