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dc.contributor.authorWei, Xinpeng
dc.contributor.authorZhao, Jianxun
dc.contributor.authorHe, Xiaoming
dc.contributor.authorHu, Zhen
dc.contributor.authorDu, Xiaoping
dc.contributor.authorHan, Daoru
dc.date.accessioned2022-02-05T22:11:41Z
dc.date.available2022-02-05T22:11:41Z
dc.date.copyright3/9/2021 12:00:00 AM
dc.date.issued2021
dc.identifier.issn2377-2158
dc.identifier.othervvuq_006_01_011006.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4277098
dc.description.abstractThis paper presents an adaptive Kriging based method to perform uncertainty quantification (UQ) of the photoelectron sheath and dust levitation on the lunar surface. The objective of this study is to identify the upper and lower bounds of the electric potential and that of dust levitation height, given the intervals of model parameters in the one-dimensional (1D) photoelectron sheath model. To improve the calculation efficiency, we employ the widely used adaptive Kriging method (AKM). A task-oriented learning function and a stopping criterion are developed to train the Kriging model and customize the AKM. Experiment analysis shows that the proposed AKM is both accurate and efficient.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleAdaptive Kriging Method for Uncertainty Quantification of the Photoelectron Sheath and Dust Levitation on the Lunar Surface
dc.typeJournal Paper
dc.journal.volume6
dc.journal.issue1
dc.journal.titleJournal of Verification, Validation and Uncertainty Quantification
dc.identifier.doi10.1115/1.4050073
dc.journal.fristpage011006-1
dc.journal.lastpage011006-10
dc.page10
dc.treeJournal of Verification, Validation and Uncertainty Quantification:;2021:;volume( 006 ):;issue: 001
dc.contenttypeFulltext


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