Statistics of Voltage Processes in Random Environment

dc.contributor.author	Grigoriu, Mircea
dc.date.accessioned	2022-02-05T22:00:06Z
dc.date.available	2022-02-05T22:00:06Z
dc.date.copyright	2/8/2021 12:00:00 AM
dc.date.issued	2021
dc.identifier.issn	2332-9017
dc.identifier.other	risk_007_01_010910.pdf
dc.identifier.uri	http://yetl.yabesh.ir/yetl1/handle/yetl/4276720
dc.description.abstract	A method is developed to characterize the performance of voltage processes X(t) harvested from primary-absorber dynamical systems subjected to Gaussian forcing functions. The method is based on properties of the Slepian model of X(t) and Monte Carlo simulation. Statistics are calculated for excursions of X(t) above levels which can be related to energy demand. The duration and the area of these excursions are used as metrics for the voltage process. Their statistics depend on the topology and the parameters of primary-absorber dynamical systems, which can be optimized to maximize the output voltage.
dc.publisher	The American Society of Mechanical Engineers (ASME)
dc.title	Statistics of Voltage Processes in Random Environment
dc.type	Journal Paper
dc.journal.volume	7
dc.journal.issue	1
dc.journal.title	ASCE-ASME J Risk and Uncert in Engrg Sys Part B Mech Engrg
dc.identifier.doi	10.1115/1.4049741
dc.journal.fristpage	010910-1
dc.journal.lastpage	010910-5
dc.page	5
dc.tree	ASCE-ASME J Risk and Uncert in Engrg Sys Part B Mech Engrg:;2021:;volume( 007 ):;issue: 001
dc.contenttype	Fulltext