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dc.contributor.authorLuloff, Mark S.
dc.contributor.authorContant, Stephane
dc.contributor.authorMorelli, Jordan
dc.contributor.authorKrause, Thomas W.
dc.date.accessioned2022-02-04T22:15:41Z
dc.date.available2022-02-04T22:15:41Z
dc.date.copyright6/26/2020 12:00:00 AM
dc.date.issued2020
dc.identifier.issn2572-3901
dc.identifier.othernde_3_4_041104.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4275209
dc.description.abstractA validated analytical model of a transmit–receive coil pair situated above two parallel plates, separated by an air gap, was used as the basis for an inversion algorithm (IA) to extract probe liftoff, second layer plate resistivity, and plate-to-plate gap from multi-frequency eddy current data. The IA was tested over a large range of first layer wall thickness (3.80–4.64 mm), second layer plate resistivity (1.7–174 µΩ cm), second layer wall thickness (1.20–4.85 mm), probe liftoff (2.8–7.9 mm), and plate-to-plate gap (0–13.3 mm). At nominal liftoff (2.8 mm), the IA achieved a gap measurement accuracy of ±0.7 mm and was able to return good estimates of the second layer resistivity within ±1 μΩ cm for low resistivity samples, but with decreasing accuracy for higher resistivities. When the gap was fixed, the IA was able to measure changes in probe liftoff (relative to nominal) to an accuracy of ±0.2 mm. The reported accuracy and a demonstration for the ability to accurately estimate parameters outside of the calibration range provide confidence in the potential utility of the algorithm.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleSimultaneous Extraction of Multiple Parameters From a Transmit–Receive Eddy Current Probe Above a Layered Planar Conductive Structure
dc.typeJournal Paper
dc.journal.volume3
dc.journal.issue4
dc.journal.titleJournal of Nondestructive Evaluation, Diagnostics and Prognostics of Engineering Systems
dc.identifier.doi10.1115/1.4047293
dc.journal.fristpage041104-1
dc.journal.lastpage041104-5
dc.page5
dc.treeJournal of Nondestructive Evaluation, Diagnostics and Prognostics of Engineering Systems:;2020:;volume( 003 ):;issue: 004
dc.contenttypeFulltext


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