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dc.contributor.authorBruno Pedrosa
dc.contributor.authorJosé A. F. O. Correia
dc.contributor.authorCarlos A. S. Rebelo
dc.contributor.authorMilan Veljkovic
dc.date.accessioned2022-01-30T21:19:20Z
dc.date.available2022-01-30T21:19:20Z
dc.date.issued9/1/2020 12:00:00 AM
dc.identifier.otherAJRUA6.0001081.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4268001
dc.description.abstractIn North America and Europe, there is a significant number of centenary metallic bridges that require maintenance and strengthening operations. These structures need to be adapted to increasing traffic intensities, and their structural integrity should be constantly evaluated. Fatigue damages were not considered in the original design of old metallic bridges, and riveted connections are one of the most frequent sources of fatigue damages on these structures. This paper intends to be a contribution for the reliable assessment of the fatigue behavior of riveted connections by proposing S-N curves for these structural details. Experimental fatigue data is analyzed from multiple bridges across Europe, and different statistical methods were implemented. A normal distribution function was implemented following the ISO 12107 standard, and the results were compared with the implementation of the two-parameter Weibull distribution function. Different estimation methodologies were implemented to determine the parameters of the Weibull distribution. S-N curves obtained by the statistical analysis were then compared with design recommendations from North American and European standards.
dc.publisherASCE
dc.titleReliability of Fatigue Strength Curves for Riveted Connections Using Normal and Weibull Distribution Functions
dc.typeJournal Paper
dc.journal.volume6
dc.journal.issue3
dc.journal.titleASCE-ASME Journal of Risk and Uncertainty in Engineering Systems, Part A: Civil Engineering
dc.identifier.doi10.1061/AJRUA6.0001081
dc.page8
dc.treeASCE-ASME Journal of Risk and Uncertainty in Engineering Systems, Part A: Civil Engineering:;2020:;Volume ( 006 ):;issue: 003
dc.contenttypeFulltext


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