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dc.contributor.authorLal, Roshan
dc.contributor.authorSaini, Rahul
dc.date.accessioned2019-09-18T09:08:14Z
dc.date.available2019-09-18T09:08:14Z
dc.date.copyright5/17/2019 12:00:00 AM
dc.date.issued2019
dc.identifier.issn0022-0434
dc.identifier.otherds_141_10_101003
dc.identifier.urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4259284
dc.description.abstractIn this article, the effect of Pasternak foundation on free axisymmetric vibration of functionally graded circular plates subjected to mechanical in-plane force and a nonlinear temperature distribution (NTD) along the thickness direction has been investigated on the basis of classical plate theory. The plate material is graded in thickness direction according to a power-law distribution and its mechanical properties are assumed to be temperature-dependent (TD). At first, the equation for thermo-elastic equilibrium and then equation of motion for such a plate model have been derived by Hamilton's principle. Employing generalized differential quadrature rule (GDQR), the numerical values of thermal displacements and frequencies for clamped and simply supported plates vibrating in the first three modes have been computed. Values of in-plane force parameter for which the plate ceases to vibrate have been reported as critical buckling loads. The effect of temperature difference, material graded index, in-plane force, and foundation parameters on the frequencies has been analyzed. The benchmark results for uniform and linear temperature distributions (LTDs) have been computed. A study for plates made with the material having temperature-independent (TI) mechanical properties has also been performed as a special case. Comparison of results with the published work has been presented.
dc.publisherAmerican Society of Mechanical Engineers (ASME)
dc.titleOn the High-Temperature Free Vibration Analysis of Elastically Supported Functionally Graded Material Plates Under Mechanical In-Plane
dc.typeJournal Paper
dc.journal.volume141
dc.journal.issue10
dc.journal.titleJournal of Dynamic Systems, Measurement, and Control
dc.identifier.doi10.1115/1.4043489
dc.journal.fristpage101003
dc.journal.lastpage101003-12
dc.treeJournal of Dynamic Systems, Measurement, and Control:;2019:;volume( 141 ):;issue: 010
dc.contenttypeFulltext


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