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dc.contributor.authorSu, Quang T.
dc.contributor.authorGharaibeh, Mohammad A.
dc.contributor.authorStewart, Aaron J.
dc.contributor.authorPitarresi, James M.
dc.contributor.authorAnselm, Martin K.
dc.date.accessioned2019-02-28T11:14:21Z
dc.date.available2019-02-28T11:14:21Z
dc.date.copyright8/20/2018 12:00:00 AM
dc.date.issued2018
dc.identifier.issn1043-7398
dc.identifier.otherep_140_04_041004.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4254175
dc.description.abstractIn this work, a sinusoidal vibration test method with resonance tracking is employed for reliability testing of circuit assemblies. The system continuously monitors for changes in the resonant frequency of the circuit board and adjusts the excitation frequency to match the resonant frequency. The test setup includes an electrodynamic shaker with a real-time vibration control, resistance monitoring for identifying electrical failures of interconnects, and vibration logging for monitoring changes in the dynamic response of the assembly over time. Reliability tests were performed using the resonance tracking sinusoidal test method for assemblies, each consisting of a centrally mounted ball grid array (BGA) device assembled with 63Sn37Pb and SAC105 solder alloys. These tests show that the resonance tracking method gives more consistent failure times. Failure analysis for the tested devices shows the primary failure mode is “input” trace crack first, followed by fatigue through the solder for complete failure. A finite element (FE) model, correlated with experimental modal analysis, is shown to accurately estimate the circuit board deflection estimated from the harmonic vibration data. This provides a means of estimating the stresses in the electronic interconnections while accounting for the variability between test parts. These fine-tuned vibration measurement techniques and related FE models provide the building blocks for high cycle solder fatigue plots (i.e., S–N curves).
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleAccelerated Vibration Reliability Testing of Electronic Assemblies Using Sine Dwell With Resonance Tracking
dc.typeJournal Paper
dc.journal.volume140
dc.journal.issue4
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4040923
dc.journal.fristpage41004
dc.journal.lastpage041004-9
dc.treeJournal of Electronic Packaging:;2018:;volume( 140 ):;issue: 004
dc.contenttypeFulltext


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