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dc.contributor.authorLiaw, Yowching
dc.contributor.authorChou, Jung-Hua
dc.date.accessioned2017-11-25T07:21:04Z
dc.date.available2017-11-25T07:21:04Z
dc.date.copyright2017/10/7
dc.date.issued2017
dc.identifier.issn1043-7398
dc.identifier.otherep_139_03_031007.pdf
dc.identifier.urihttp://138.201.223.254:8080/yetl1/handle/yetl/4236868
dc.description.abstractEncapsulation molding compounds (EMCs) are commonly used to protect integrated circuit (IC) chips. Their composition always contains fillers of a large amount (about 70%) and will affect the properties of the compounds. Thus, in order to clarify the filler effects, in this study, three types of silica fillers including crystal silica, edgeless silica, and fused silica were studied experimentally to explore their effects on the compounds. The results show that all of the flow spiral length, glass transition temperature (Tg), coefficient of thermal expansion (CTE), and water absorption rate of the encapsulation molding compounds decrease as the filler amount increases, irrespective of the filler type. In contrast, both thermal conductivity and flexural strength of the compounds increase as the filler amount increases, but also irrespective of the filler type. For the three fillers, the edgeless silica filler has the advantage of a large flow spiral length and can be molded better. It also has a larger thermal conductivity, larger flexural strength, and lower water absorption rate. Hence, for low stress industrial applications, the edgeless silica should be adopted as the filler of the encapsulation molding compounds.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleThe Effects of Silica Fillers on the Properties of Encapsulation Molding Compounds
dc.typeJournal Paper
dc.journal.volume139
dc.journal.issue3
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4037145
dc.journal.fristpage31007
dc.journal.lastpage031007-6
dc.treeJournal of Electronic Packaging:;2017:;volume( 139 ):;issue: 003
dc.contenttypeFulltext


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