Show simple item record

Thermal Cycle Stability of Sealing Glass for 8YSZ Coated Cr-Containing Metal Interconnect

dc.contributor.authorPeng, Lian
dc.contributor.authorBai, Yang
dc.contributor.authorZhu, Qingshan
dc.date.accessioned2017-11-25T07:20:57Z
dc.date.available2017-11-25T07:20:57Z
dc.date.copyright2017/01/24
dc.date.issued2016
dc.identifier.issn2381-6872
dc.identifier.otherjeecs_013_04_041002.pdf
dc.identifier.urihttp://138.201.223.254:8080/yetl1/handle/yetl/4236785
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleThermal Cycle Stability of Sealing Glass for 8YSZ Coated Cr-Containing Metal Interconnect
dc.typeJournal Paper
dc.journal.volume13
dc.journal.issue4
dc.journal.titleJournal of Electrochemical Energy Conversion and Storage
dc.identifier.doi10.1115/1.4035624
dc.journal.fristpage41002
dc.journal.lastpage041002-7
dc.treeJournal of Electrochemical Energy Conversion and Storage:;2016:;volume( 013 ):;issue: 004
dc.contenttypeFulltext


Files in this item

Thumbnail
Name:
jeecs_013_04_041002.pdf
Size:
2.491Mb
Format:
PDF
View/Open

This item appears in the following Collection(s)

Show simple item record