Show simple item record

dc.contributor.authorGarcia, Philip
dc.contributor.authorOffutt, Susan E.
dc.contributor.authorPinar, Musa
dc.contributor.authorChangnon, Stanley A.
dc.date.accessioned2017-06-09T14:01:55Z
dc.date.available2017-06-09T14:01:55Z
dc.date.copyright1987/09/01
dc.date.issued1987
dc.identifier.issn0733-3021
dc.identifier.otherams-11218.pdf
dc.identifier.urihttp://onlinelibrary.yabesh.ir/handle/yetl/4146422
dc.description.abstractThis study explores the relationships between U.S. corn yields (level and stability), advances in technology, and weather. Evaluations at the farm, sub-state, and national levels reveal no evidence of yield plateaus, and absolute, but not relative, yield variability increased over time. When yield behavior is adjusted for weather, variances are more likely to be equal between early and late periods. Results suggest that technology has not been the only determinant of changing yield risk, and emphasize the importance of weather conditions in assessing them effects.
dc.publisherAmerican Meteorological Society
dc.titleCorn Yield Behavior: Effects of Technological Advance and Weather-Conditions
dc.typeJournal Paper
dc.journal.volume26
dc.journal.issue9
dc.journal.titleJournal of Climate and Applied Meteorology
dc.identifier.doi10.1175/1520-0450(1987)026<1092:CYBEOT>2.0.CO;2
dc.journal.fristpage1092
dc.journal.lastpage1102
dc.treeJournal of Climate and Applied Meteorology:;1987:;Volume( 026 ):;Issue: 009
dc.contenttypeFulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record