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dc.contributor.authorWu, Man-Li C.
dc.date.accessioned2017-06-09T14:00:17Z
dc.date.available2017-06-09T14:00:17Z
dc.date.copyright1984/07/01
dc.date.issued1984
dc.identifier.issn0733-3021
dc.identifier.otherams-10751.pdf
dc.identifier.urihttp://onlinelibrary.yabesh.ir/handle/yetl/4145903
dc.description.abstractTo parameterize emissivity of clouds at 11 ?m, a study has been made in an effort to understand the radiation field of thin clouds. The contributions to the intensity and flux from different sources and through different physical processes are calculated by using the method of successive orders of scattering. The effective emissivity of thin clouds is decomposed into the effective absorption emissivity, effective scattering emissivity, and effective reflection emissivity. The effective absorption emissivity depends on the absorption and emission of the cloud; it is parameterized in terms of optical thickness. The effective scattering emissivity depends on the scattering properties of the cloud; it is parameterized in terms of optical thickness and single scattering albedo. The effective reflection emissivity follows the similarity relation as in the near infrared cases. This is parameterized in terms of the similarity parameter and optical thickness, as well as the temperature difference between the cloud and ground.
dc.publisherAmerican Meteorological Society
dc.titleRadiation Properties and Emissivity Parameterization of High Level Thin Clouds
dc.typeJournal Paper
dc.journal.volume23
dc.journal.issue7
dc.journal.titleJournal of Climate and Applied Meteorology
dc.identifier.doi10.1175/1520-0450(1984)023<1138:RPAEPO>2.0.CO;2
dc.journal.fristpage1138
dc.journal.lastpage1147
dc.treeJournal of Climate and Applied Meteorology:;1984:;volume( 023 ):;issue: 007
dc.contenttypeFulltext


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