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dc.contributor.authorBrunschwiler, Thomas
dc.contributor.authorSridhar, Arvind
dc.contributor.authorLee Ong, Chin
dc.contributor.authorSchlottig, Gerd
dc.date.accessioned2017-05-09T01:27:25Z
dc.date.available2017-05-09T01:27:25Z
dc.date.issued2016
dc.identifier.issn1528-9044
dc.identifier.otherep_138_01_010911.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/160797
dc.description.abstractAn overview of the thermal management landscape with focus on heat dissipation from threedimensional (3D) chip stacks is provided in this study. Evolutionary and revolutionary topologies, such as singleside, dualside, and finally, volumetric heat removal, are benchmarked with respect to a highperformance threetier chip stack with an aggregate power dissipation of 672 W. The thermal budget of 50 K can be maintained by three topologies, namely: (1) dualside cooling, implemented by a thermally active interposer, (2) interlayer cooling with fourport fluid delivery and drainage at 100 kPa pressure drop, and (3) a hybrid approach combining interlayer with embedded backside cooling. Of all the heatremoval concepts, interlayer cooling is the only approach that scales with the number of dies in the chip stack and hence enables extreme 3D integration. However, the required size of the microchannels competes with the requirement of low throughsiliconvia (TSV) heights and pitches. A scaling study was performed to derive the TSV pitch that is compatible with cooling channels to dissipate 150 W/cm2 per tier. An active integrated circuit (IC) area of 4 cm2 was considered, which had to be implemented on the varying tier count in the stack. A cuboid form factor of 2 mm أ— 4 mm أ— 2.55 mm results from a die count of 50. The resulting microchannels of 2 mm length allow small hydraulic diameters and thus a very high TSV density of 1837 1/mm2. The accumulated heat flux and the volumetric power dissipation are as high as 7.5 kW/cm2 and 29 kW/cm3, respectively.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleBenchmarking Study on the Thermal Management Landscape for Three Dimensional Integrated Circuits: From Back Side to Volumetric Heat Removal
dc.typeJournal Paper
dc.journal.volume138
dc.journal.issue1
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4032492
dc.journal.fristpage10911
dc.journal.lastpage10911
dc.identifier.eissn1043-7398
dc.treeJournal of Electronic Packaging:;2016:;volume( 138 ):;issue: 001
dc.contenttypeFulltext


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