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dc.contributor.authorSadiq, Muhammad
dc.contributor.authorLecomte, Jean
dc.contributor.authorCherkaoui, Mohammed
dc.date.accessioned2017-05-09T01:16:59Z
dc.date.available2017-05-09T01:16:59Z
dc.date.issued2015
dc.identifier.issn1528-9044
dc.identifier.otherep_137_03_031005.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/157694
dc.description.abstractSn–Ag–Cu (SAC) alloys are considered as good replacements of Sn–Pb alloys which are banned due to the toxic nature of Pb. But, SAC alloys have a coarse microstructure that consists of خ²Sn rich and eutectic phases. Nanoindentation is a useful technique to evaluate the mechanical properties at very small length scale. In this work, continuous stiffness measurement (CSM) nanoindentation setup (CSM Instruments SA, Peseux, Switzerland) is used to determine the individual phase mechanical properties like Young's modulus and hardness at high temperatures. It is demonstrated that these properties are a function of temperature for both خ²Sn rich and eutectic phases. Loadings starting from 500 خ¼N up to 5000 خ¼N are used with 500 خ¼N steps and average values are presented for Young's modulus and hardness. The loading rates applied are twice that of the loadings. High temperatures result in a higher creep deformation and therefore, to avoid it, different dwell times are used at peak loads. The special pileup effect, which is more significant at elevated temperatures, is determined and incorporated into the results. A better agreement is found with the previous studies.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleIndividual Phase Mechanical Properties at Different Temperatures of Sn–Ag–Cu Lead Free Solders Incorporating Special Pileup Effects Using Nanoindentation
dc.typeJournal Paper
dc.journal.volume137
dc.journal.issue3
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4029836
dc.journal.fristpage31005
dc.journal.lastpage31005
dc.identifier.eissn1043-7398
dc.treeJournal of Electronic Packaging:;2015:;volume( 137 ):;issue: 003
dc.contenttypeFulltext


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