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dc.contributor.authorKhan, Rizwan A.
dc.contributor.authorAhmad, Suhail
dc.date.accessioned2017-05-09T01:11:41Z
dc.date.available2017-05-09T01:11:41Z
dc.date.issued2014
dc.identifier.issn0892-7219
dc.identifier.otheromae_136_02_021602.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/156050
dc.description.abstractThe design of welded structures for the fatigue limit state is normally carried out by means of either linear or bilinear SN curves, which have been found adequate to predict crack initiation only. To properly assess the effects of the design, fabrication, inspection, and repair strategy for structure degradation due to crack growth, fracture mechanics (FM) models need to be applied. In this paper, alternative SN and FM formulations of fatigue are investigated. The probabilistic fracture mechanics approach predicts the fatigue life of welded steel structures in the presence of cracks under random spectrum loading. It is based on a recently proposed bilinear relationship to model fatigue crack growth. Uncertainty modeling, especially on fatigue crack growth parameters, is undertaken with the aid of recently published data in support of the bilinear crack growth relationship. Results pertaining to the fatigue reliability and fatigue crack size evolution are presented using the Monte Carlo simulation technique and the emphasis is placed on a comparison between the linear and bilinear crack growth models. Variations in the system configuration, service life, and coefficients of crack growth laws have been studied on the parametric basis
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleBi Linear Fatigue and Fracture Approach for Safety Analysis of an Offshore Structure
dc.typeJournal Paper
dc.journal.volume136
dc.journal.issue2
dc.journal.titleJournal of Offshore Mechanics and Arctic Engineering
dc.identifier.doi10.1115/1.4026669
dc.journal.fristpage21602
dc.journal.lastpage21602
dc.identifier.eissn1528-896X
dc.treeJournal of Offshore Mechanics and Arctic Engineering:;2014:;volume( 136 ):;issue: 002
dc.contenttypeFulltext


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