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dc.contributor.authorYang, Chaoran
dc.contributor.authorSong, Fubin
dc.contributor.authorRicky Lee, S. W.
dc.date.accessioned2017-05-09T01:06:44Z
dc.date.available2017-05-09T01:06:44Z
dc.date.issued2014
dc.identifier.issn1528-9044
dc.identifier.otherep_136_01_011003.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/154443
dc.description.abstractSnCuNi is one of the most common ternary intermetallic compounds formed in the Snbased solder joint, and its formation and properties can be greatly influenced by the amount of Ni. Ni can participate in the interfacial reaction and diffuse into the intermetallic compound layer from either the solder or from the pad. In this research, comparative studies of different SnCuNi intermetallic compounds were conducted using two kinds of SnCuNi solders with organic solderability preservatives pad finish and a SnCu solder with electroless nickel/immersion gold pad finish. In the former case, Ni can only diffuse into the intermetallic compound from the solder matrix, while in the latter the Ni is only from the metallization layer on the Cu base. Scanning electron microscopy and transmission electron microscopy were employed to inspect the morphologies and interfacial microstructures of the intermetallic compounds. The thermal aging test was conducted to investigate their growth behavior under elevated temperature conditions. Mechanical strength after different aging hours was also evaluated via high speed ball pull test.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleComparison of Ball Pull Strength Among Various Sn Cu Ni Solder Joints With Different Pad Surface Finishes
dc.typeJournal Paper
dc.journal.volume136
dc.journal.issue1
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4025915
dc.journal.fristpage11003
dc.journal.lastpage11003
dc.identifier.eissn1043-7398
dc.treeJournal of Electronic Packaging:;2014:;volume( 136 ):;issue: 001
dc.contenttypeFulltext


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