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dc.contributor.authorCullinan, Michael A.
dc.contributor.authorCulpepper, Martin L.
dc.date.accessioned2017-05-09T01:01:46Z
dc.date.available2017-05-09T01:01:46Z
dc.date.issued2013
dc.identifier.issn2166-0468
dc.identifier.otherjmnm_1_1_011011.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/152859
dc.description.abstractCarbon nanotube (CNT)based piezoresistive strain sensors have the potential to outperform traditional siliconbased piezoresistors in MEMS devices due to their high strain sensitivity. However, the resolution of CNTbased piezoresistive sensors is currently limited by excessive 1/f or flicker noise. In this paper, we will demonstrate several nanomanufacturing methods that can be used to decrease noise in the CNTbased sensor system without reducing the sensor's strain sensitivity. First, the CNTs were placed in a parallel resistor network to increase the total number of charge carriers in the sensor system. By carefully selecting the types of CNTs used in the sensor system and by correctly designing the system, it is possible to reduce the noise in the sensor system without reducing sensitivity. The CNTs were also coated with aluminum oxide to help protect the CNTs from environmental effects. Finally, the CNTs were annealed to improve contact resistance and to remove adsorbates from the CNT sidewall. The optimal annealing conditions were determined using a designofexperiments (DOE). Overall, using these noise mitigation techniques it is possible to reduce the total noise in the sensor system by almost 3 orders of magnitude and increase the dynamic range of the sensors by 48 dB.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleNanomanufacturing Methods for the Reduction of Noise in Carbon Nanotube Based Piezoresistive Sensor Systems
dc.typeJournal Paper
dc.journal.volume1
dc.journal.issue1
dc.journal.titleJournal of Micro and Nano
dc.identifier.doi10.1115/1.4023159
dc.journal.fristpage11011
dc.journal.lastpage11011
dc.identifier.eissn1932-619X
dc.treeJournal of Micro and Nano-Manufacturing:;2013:;volume( 001 ):;issue: 001
dc.contenttypeFulltext


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