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dc.contributor.authorTao, Bo
dc.contributor.authorWu, Guanghua
dc.contributor.authorYin, Zhouping
dc.contributor.authorXiong, Youlun
dc.date.accessioned2017-05-09T00:57:46Z
dc.date.available2017-05-09T00:57:46Z
dc.date.issued2013
dc.identifier.issn1528-9044
dc.identifier.otherep_135_04_041008.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/151448
dc.description.abstractHygrothermal environments can degrade anisotropic conductive adhesive (ACA) joints by weakening the shear strength of adhesive interface. In this paper, the shear strength degradation model of ACA joints under hygrothermal conditions was formulated through experimental testing and theoretical modeling. The shear strength degradation data were obtained from different hygrothermal aging tests and the ACA moisture properties were characterized for the corresponding hygrothermal conditions. Theoretical models considering the hygrothermal factors of T (temperature), RH (relative humidity), and t (time), were used to fit the shear strength degradation data. It was found that the inverse exponential law was the best candidate model to predict the degradation data. The shear strength degradation model of ACA joints under hygrothermal conditions was proposed, where the relationship of the S (shear strength) and the hygrothermal factors (T, RH, and t) was expressed in an analytical model. The degradation model was validated by experiments, and the model predictions agreed well with the test results.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleA Shear Strength Degradation Model for Anisotropic Conductive Adhesive Joints Under Hygrothermal Conditions
dc.typeJournal Paper
dc.journal.volume135
dc.journal.issue4
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4025840
dc.journal.fristpage41008
dc.journal.lastpage41008
dc.identifier.eissn1043-7398
dc.treeJournal of Electronic Packaging:;2013:;volume( 135 ):;issue: 004
dc.contenttypeFulltext


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