• Login
    View Item 
    •   DSpace Home
    • ASME
    • Journal of Electronic Packaging
    • View Item
    •   DSpace Home
    • ASME
    • Journal of Electronic Packaging
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Finite Element Analysis for Shock Resistance Evaluation of Cushion Packaged Multifunction Printer Considering Internal Modules

    Thumbnail
    View/Open
    ep_135_04_041001.pdf (3.496Mb)
    Date
    2013
    Author
    Kim, Se
    Cho, Dae
    Kim, Tae
    Jung, Se
    Koo, Ja
    Kim, Moon
    Choi, Jae
    Metadata
    Show full item record
    Abstract
    Failures in IT electronics are often caused by falling or external shocks during transportation. These failures cause customers to mistrust the reliability of the products. Many manufacturers of IT electronics have not only used cushioning materials but also increased the shock resistance of their products for failure prevention. Especially in case of printer products, the design of the packaging and the product robustness are extremely important because of their substantial weight and the fragility of the internal modules. For product design, it is essential to understand the impact failure mechanism of the products. In this study, a compression test, a drop impact test, and a finite element analysis (FEA) were performed to analyze the dynamic behaviors of a packaged multifunction printer (MFP). The mechanical properties of a cushioning material were measured by compression tests. The FE models of the cushion packaging and the MFP included the physical characteristics of the internal modules, and their dynamic behaviors were obtained using the commercial software lsdyna3d. Simulation results were also compared with drop test results to verify the proposed FE models. The shock resistance of the MFP was assessed by stress analysis and strength evaluation. We also expect our FE models will be useful for evaluating the fragility of the internal modules because the models can numerically estimate the shock acceleration profiles of the internal modules, which are difficult to measure experimentally.
    URI
    http://yetl.yabesh.ir/yetl/handle/yetl/151440
    Collections
    • Journal of Electronic Packaging

    DSpace software copyright © 2002-2015  DuraSpace
    Contact Us | Send Feedback
    Theme by 
    @mire NV
     

     

    Browse

    All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    LoginRegister

    Statistics

    View Usage Statistics

    DSpace software copyright © 2002-2015  DuraSpace
    Contact Us | Send Feedback
    Theme by 
    @mire NV