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dc.contributor.authorKim, Hogyoung
dc.contributor.authorSohn, Ahrum
dc.contributor.authorCho, Yunae
dc.contributor.authorKim, Dong
dc.date.accessioned2017-05-09T00:57:38Z
dc.date.available2017-05-09T00:57:38Z
dc.date.issued2013
dc.identifier.issn1528-9044
dc.identifier.otherep_135_1_011010.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/151407
dc.description.abstractThe temperaturedependent electrical properties of Ag Schottky contacts to differently grown Opolar bulk ZnO single crystals were comparatively investigated in the temperature range of 100–300 K. Schottky contact to hydrothermal ZnO produced the higher barrier heights (lower ideality factors) than that of pressurized meltgrown ZnO. The modified Richardson plots for two samples produced the larger Richardson constant compared to the theoretical value of 32 A cm−2 K−2 for ntype ZnO, indicating that the inhomogeneous barrier height with the thermionic emission (TE) model could not explain the current transport. The conductive accumulation layers on the ZnO surfaces might not be removed effectively for two samples, which degraded the rectifying characteristics. The different electron transport characteristics between hydrothermal and pressurized meltgrown ZnO could be explained by the different degree of AgO formation at the interface.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleTemperature Dependent Electrical Characteristics of Ag Schottky Contacts to Differently Grown O Polar Bulk ZnO
dc.typeJournal Paper
dc.journal.volume135
dc.journal.issue1
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4023404
dc.journal.fristpage11010
dc.journal.lastpage11010
dc.identifier.eissn1043-7398
dc.treeJournal of Electronic Packaging:;2013:;volume( 135 ):;issue: 001
dc.contenttypeFulltext


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