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dc.contributor.authorB. Fiedler
dc.contributor.authorK. Kao
dc.contributor.authorL. Keer
dc.contributor.authorM. Fine
dc.date.accessioned2017-05-09T00:49:25Z
dc.date.available2017-05-09T00:49:25Z
dc.date.copyrightSeptember, 2012
dc.date.issued2012
dc.identifier.issn1528-9044
dc.identifier.otherJEPAE4-926029#031006_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/148576
dc.description.abstractIn displacement controlled mechanical fatigue of ball grid solder interconnect arrays, decrease in maximum load monitors total increase in crack area in an array while electrical resistance monitors only the area of large cracks that lead to electrical failure. Small cracks with good electrical contact between the crack surfaces have only minor effect on the resistance of the array. In this mechanical fatigue research of ball grid arrays, the fatigue damage was continually followed by simultaneously measuring maximum load and electrical resistance. Experimental details, results, and analysis of the results are given including a Paris relation fit to the data.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleMonitoring Fatigue Cracking in Interconnects in a Ball Grid Array by Measuring Electrical Resistance
dc.typeJournal Paper
dc.journal.volume134
dc.journal.issue3
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4006708
dc.journal.fristpage31006
dc.identifier.eissn1043-7398
dc.keywordsElectrical resistance
dc.keywordsStress
dc.keywordsFracture (Materials)
dc.keywordsFailure
dc.keywordsFatigue cracks
dc.keywordsBall-Grid-Array packaging
dc.keywordsShear (Mechanics)
dc.keywordsCycles
dc.keywordsFatigue
dc.keywordsDisplacement AND Solders
dc.treeJournal of Electronic Packaging:;2012:;volume( 134 ):;issue: 003
dc.contenttypeFulltext


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