• Login
    View Item 
    •   DSpace Home
    • ASME
    • Journal of Electronic Packaging
    • View Item
    •   DSpace Home
    • ASME
    • Journal of Electronic Packaging
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Study of Solder/Copper Interface Behavior Under Varying Strain Rates

    Thumbnail
    View/Open
    JEPAE4-926029#031003_1.pdf (1.731Mb)
    Date
    2012
    Author
    Y. W. Kwon
    A. M. Luteran
    J. M. Didoszak
    A. S. Kwon
    Metadata
    Show full item record
    Abstract
    This paper investigates the mechanical behavior of a copper–solder interface when subjected to varying strain rate loading between 0.05 s−1 and 10.0 s−1 . The copper is alloy 101, and the solder is lead-free type with a composition of 96% tin and 4% silver. Both uniform and nonuniform two-level strain rate loadings were applied. For the two-level strain rate loading, the strain rate was changed from one level to another during the loading process as a step change. The strain rate tests were performed at room temperature as well as at an elevated temperature of 65 °C. The test results showed significant effects of uniform and nonuniform strain rates as well as temperature on fracture surface, peak stress, fracture strain, modulus, and stored energy density until fracture. Generally, a higher strain rate increased the peak stress and fracture strain, but decreased the modulus. The heated specimens showed significantly reduced strength and fracture strain at high strain rates when compared to the specimens tested at room temperature. For the two-level strain rates, the sequence of the loading rates affected the material behavior significantly. The peak stress under the two-level strain rates might be located outside the range that was determined by the two individual uniform strain rates occurring in the two-level rates. On the other hand, the fracture strain under two-level strain rate loading always fell inside that range. An expression was proposed to predict the interface fracture strains for the case of a two-level strain rate loading based on the data of each respective single-level strain test. The prediction was reasonable when compared to the experimental data with an average absolute error of 10%.
    URI
    http://yetl.yabesh.ir/yetl/handle/yetl/148573
    Collections
    • Journal of Electronic Packaging

    DSpace software copyright © 2002-2015  DuraSpace
    Contact Us | Send Feedback
    Theme by 
    @mire NV
     

     

    Browse

    All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    LoginRegister

    Statistics

    View Usage Statistics

    DSpace software copyright © 2002-2015  DuraSpace
    Contact Us | Send Feedback
    Theme by 
    @mire NV