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dc.contributor.authorH. Kück
dc.contributor.authorThomas Fellner
dc.contributor.authorElena Zukowski
dc.contributor.authorH. Richter
dc.contributor.authorM. Schober
dc.contributor.authorJürgen Wilde
dc.contributor.authorP. Buckmüller
dc.date.accessioned2017-05-09T00:49:24Z
dc.date.available2017-05-09T00:49:24Z
dc.date.copyrightSeptember, 2012
dc.date.issued2012
dc.identifier.issn1528-9044
dc.identifier.otherJEPAE4-926029#031002_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/148572
dc.description.abstractThis investigation is aimed at the modeling of both the fabrication process and the reliability of press-fit interconnections on moulded interconnect devices (MID). These are multifunctional three-dimensional substrates, produced by thermoplastic injection moulding for large-series applications. The assembly process and subsequently the durability of press-fit interconnections has been modeled and proved with a finite element software. Especially, a simulation tool for process optimizations was created and applied. In order to obtain realistic results, a creep model for the investigated base material, a liquid-crystal polymer (LCP), was generated and verified by experiments. Required friction coefficients between metal pin and base material were determined by adapting simulations and experiments. Retention forces of pins pressed into substrate holes during as well after the assembly process, and after temperature loads were predicted by simulations. Additionally, the decreasing extraction forces over time due to creep in the thermoplastic base material have been predicted for different storage temperatures as well with finite element analyses. Following, the numerical results of the process and reliability modeling were verified by experiments. It is concluded that the behavior of the mechanical contact of the pin-substrate system, can be suitably described time- and temperature-dependent.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleModeling of Thermoplastic Materials for the Process-Simulation of Press-Fit Interconnections on Moulded Interconnected Devices
dc.typeJournal Paper
dc.journal.volume134
dc.journal.issue3
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4006927
dc.journal.fristpage31002
dc.identifier.eissn1043-7398
dc.keywordsForce
dc.keywordsTemperature
dc.keywordsStress
dc.keywordsPresses
dc.keywordsModeling
dc.keywordsReliability AND Creep
dc.treeJournal of Electronic Packaging:;2012:;volume( 134 ):;issue: 003
dc.contenttypeFulltext


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