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dc.contributor.authorLuigi P. M. Colombo
dc.contributor.authorAlexey Petrushin
dc.contributor.authorDavide Paleari
dc.date.accessioned2017-05-09T00:43:12Z
dc.date.available2017-05-09T00:43:12Z
dc.date.copyrightJune, 2011
dc.date.issued2011
dc.identifier.issn1528-9044
dc.identifier.otherJEPAE4-26313#021006_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/145812
dc.description.abstractSimplified integrated approaches to thermal modeling of electronics packages call for fast and easy thermal models. However, this is often in contrast with the complexity of the thermal problem to be solved, which prevents the application of simplified approaches. After a review of the available modeling strategies, steady state thermal analysis of a typical stacked ball grid array package based on a thermal resistance network is presented. The physical model is discussed in detail, together with its advantages and limitations. The results have been compared with detailed 3D-simulations performed by means of a commercial code: for thermal design purposes, the accuracy is satisfactorily, leading a prediction error of the junction temperature lower than 10%.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleSimplified Thermal Model of a Stacked Ball Grid Array Package
dc.typeJournal Paper
dc.journal.volume133
dc.journal.issue2
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4003991
dc.journal.fristpage21006
dc.identifier.eissn1043-7398
dc.keywordsTemperature
dc.keywordsSolders
dc.keywordsElectrical resistance
dc.keywordsBall-Grid-Array packaging
dc.keywordsNetworks
dc.keywordsThermal resistance
dc.keywordsErrors
dc.keywordsBoundary-value problems AND Junctions
dc.treeJournal of Electronic Packaging:;2011:;volume( 133 ):;issue: 002
dc.contenttypeFulltext


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