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dc.contributor.authorChu-Hsuan Sha
dc.contributor.authorChin C. Lee
dc.date.accessioned2017-05-09T00:43:12Z
dc.date.available2017-05-09T00:43:12Z
dc.date.copyrightJune, 2011
dc.date.issued2011
dc.identifier.issn1528-9044
dc.identifier.otherJEPAE4-26313#021003_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/145808
dc.description.abstractPure gold (Au) is used as a bonding medium to bond silicon (Si) chips to alumina substrates. The bonding process is performed at 260 °C with only 150 psi (1.0 MPa) static pressure applied. This is a solid-state bonding without any molten phase involved. The Au layer plated on alumina is ductile enough to deform for its surface to mate with the thin Au layer coated on Si. Au atoms on both sides of the bond line are brought within atomic distance and bonding is achieved. The ductile Au joint also accommodates the significant mismatch in coefficient of thermal expansion (CTE) between Si and alumina. Scanning electron microscope (SEM) evaluations show that nearly perfect joints are achieved and no voids are observed. Five samples are shear tested. They all pass the MIL-STD-883G standard. This bonding technique can be applied to bonding any two objects that can be coated with smooth Au layers. The 260 °C bonding temperature is compatible with typical reflow temperature of Sn3.5Ag solders used in electronic industries.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleLow Temperature Solid State Gold Bonding of Si Chips to Alumina Substrates
dc.typeJournal Paper
dc.journal.volume133
dc.journal.issue2
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4003868
dc.journal.fristpage21003
dc.identifier.eissn1043-7398
dc.keywordsBonding
dc.keywordsSilicon chips
dc.keywordsPressure
dc.keywordsShear (Mechanics)
dc.keywordsLow temperature AND Temperature
dc.treeJournal of Electronic Packaging:;2011:;volume( 133 ):;issue: 002
dc.contenttypeFulltext


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