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dc.contributor.authorFeng Gao
dc.contributor.authorJianmin Qu
dc.contributor.authorMatthew Yao
dc.date.accessioned2017-05-09T00:43:11Z
dc.date.available2017-05-09T00:43:11Z
dc.date.copyrightJune, 2011
dc.date.issued2011
dc.identifier.issn1528-9044
dc.identifier.otherJEPAE4-26313#020908_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/145804
dc.description.abstractReported in this paper is a quantum mechanics study on the electronic structure and contact resistance at the interfaces formed when an open-end single-walled carbon nanotube (CNT) is in end-contact with aluminum (Al) and palladium (Pd), respectively. The electronic structures are computed using a density functional theory (DFT), and the transmission coefficient is calculated using a nonequilibrium Green’s function (NEGF) in conjunction with the DFT. The current–voltage relation of the simulating cell is obtained by using the Landauer–Buttiker formula, from which the contact resistance can be determined. Our results show that the electronic structure and electron transport behavior are strongly dependent on the electrode. It is found that the CNT/Pd interface has a weaker bond than the CNT/Al interface. However, the CNT/Pd interface shows a lower electrical contact resistance.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleElectrical Contact Resistance at the Carbon Nanotube/Pd and Carbon Nanotube/Al Interfaces in End-Contact by First-Principles Calculations
dc.typeJournal Paper
dc.journal.volume133
dc.journal.issue2
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4004095
dc.journal.fristpage20908
dc.identifier.eissn1043-7398
dc.keywordsCarbon nanotubes
dc.keywordsContact resistance
dc.keywordsMetals
dc.keywordsElectrodes AND Electron transport
dc.treeJournal of Electronic Packaging:;2011:;volume( 133 ):;issue: 002
dc.contenttypeFulltext


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