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dc.contributor.authorThao D. Nguyen
dc.contributor.authorJ. D. Yeager
dc.contributor.authorD. P. Adams
dc.contributor.authorN. R. Moody
dc.contributor.authorD. F. Bahr
dc.date.accessioned2017-05-09T00:37:58Z
dc.date.available2017-05-09T00:37:58Z
dc.date.copyrightApril, 2010
dc.date.issued2010
dc.identifier.issn0094-4289
dc.identifier.otherJEMTA8-27128#021001_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/143346
dc.description.abstractNanoindentation is widely used to characterize the mechanical and interfacial properties of thin film systems. However, the effects of substrate compliance on the indentation response of compliant substrate systems are not well understood. This paper investigates the effects of the large compliance mismatch between the film and the substrate and of the film thickness for model systems using nanoindentation tests, finite element simulations, and an analytical model based on a classical plate-bending solution. The results showed that for displacements less than the film thickness and for ratio of the substrate to film modulus less than 100. The indentation force-displacement response exhibits a linear relationship that can be predicted accurately by the linear plate-bending model. The effective stiffness depends linearly on the film thickness and also on the substrate and film moduli. For larger displacements, the indentation response exhibits the scaling relationship of the nonlinear plate-bending model.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleNanoindentation of Compliant Substrate Systems: Effects of Geometry and Compliance
dc.typeJournal Paper
dc.journal.volume132
dc.journal.issue2
dc.journal.titleJournal of Engineering Materials and Technology
dc.identifier.doi10.1115/1.4000230
dc.journal.fristpage21001
dc.identifier.eissn1528-8889
dc.keywordsFinite element analysis
dc.keywordsDisplacement
dc.keywordsFilm thickness
dc.keywordsForce
dc.keywordsNanoindentation
dc.keywordsStiffness
dc.keywordsEngineering simulation
dc.keywordsFinite element model
dc.keywordsGeometry AND Thin films
dc.treeJournal of Engineering Materials and Technology:;2010:;volume( 132 ):;issue: 002
dc.contenttypeFulltext


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