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dc.contributor.authorZ. Kornain
dc.contributor.authorA. Jalar
dc.contributor.authorR. Rasid
dc.contributor.authorS. Abdullah
dc.date.accessioned2017-05-09T00:37:12Z
dc.date.available2017-05-09T00:37:12Z
dc.date.copyrightDecember, 2010
dc.date.issued2010
dc.identifier.issn1528-9044
dc.identifier.otherJEPAE4-26309#041012_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/142935
dc.description.abstractPhenolic and amine epoxy systems are widely used as hardeners in underfill materials for flip chip packaging. A comparison was made between these two systems in order to evaluate the reliability performance of a flip chip plastic ball grid array (FC-PBGA). The coefficient of thermal expansion, glass transition temperature (Tg), Young’s modulus (E), and fracture toughness were revealed by using a thermal mechanical analyzer, a dynamic mechanical analyzer, and a single-edge notch three-point bending test, while moisture absorption study was performed using an 85°C/85% relative humidity chamber. The adhesion strength with different conditions of temperature and humidity was performed using a die shear test. The series of standard reliability tests such as accelerated temperature cycle test, pressure cooker test, thermal humidity storage test, and high temperature storage test were executed upon the FC-PBGA, which was filled by phenolic and amine epoxy systems of underfill materials. It was found that the adhesion strength of phenolic-based underfills is better than that of amine-based underfills in almost all test conditions. Phenolic-based underfills also demonstrated better reliability compared with amine-based underfills.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleComparative Study of Phenolic-Based and Amine-Based Underfill Materials in Flip Chip Plastic Ball Grid Array Package
dc.typeJournal Paper
dc.journal.volume132
dc.journal.issue4
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4002741
dc.journal.fristpage41012
dc.identifier.eissn1043-7398
dc.keywordsTemperature
dc.keywordsAbsorption
dc.keywordsReliability
dc.keywordsShear (Mechanics)
dc.keywordsFracture toughness
dc.keywordsBall-Grid-Array packaging
dc.keywordsFlip-chip
dc.keywordsFailure
dc.keywordsPackaging
dc.keywordsEpoxy adhesives
dc.keywordsElasticity
dc.keywordsMechanical properties
dc.keywordsStress
dc.keywordsCycles
dc.keywordsStorage
dc.keywordsHigh temperature
dc.keywordsGlass transition
dc.keywordsBending strength AND Pressure
dc.treeJournal of Electronic Packaging:;2010:;volume( 132 ):;issue: 004
dc.contenttypeFulltext


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