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dc.contributor.authorM. A. Neidigk
dc.contributor.authorY.-L. Shen
dc.date.accessioned2017-05-09T00:32:21Z
dc.date.available2017-05-09T00:32:21Z
dc.date.copyrightMarch, 2009
dc.date.issued2009
dc.identifier.issn1528-9044
dc.identifier.otherJEPAE4-26292#011003_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/140319
dc.description.abstractThe generation of thermal stresses is a major cause for mechanical failure in encapsulated electronic components. In this study numerical modeling is employed to analyze thermal stresses in a high-voltage transformer encapsulated with filled epoxy. The transformer assembly consists of materials with an extremely disparate range of thermomechanical properties. The thermal histories considered mimic those in the operational condition. It is found that, upon thermal cooling from elevated temperature, the ceramic core can be under local tensile stress although it is entirely surrounded by materials with much greater coefficients of thermal expansion. The unique aspect of this paper originates from the fact that the volume shrinkage of the viscoelastic encapsulant during physical aging contributes to an increase in stress over time, thus increasing the tendency of fracture. This counter intuitive result (stress increase due to nonlinear viscoelastic physical aging) can now be predicted using constitutive models recently developed at Sandia National Laboratories. When a silicone coating between the core and the encapsulation is included, the stress is significantly reduced. The modeling result is shown to corroborate with the actual performance of the transformer.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleNonlinear Viscoelastic Finite Element Analysis of Physical Aging in an Encapsulated Transformer
dc.typeJournal Paper
dc.journal.volume131
dc.journal.issue1
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.3068298
dc.journal.fristpage11003
dc.identifier.eissn1043-7398
dc.keywordsCoating processes
dc.keywordsCoatings
dc.keywordsCeramics
dc.keywordsComputer simulation
dc.keywordsManufacturing
dc.keywordsFerrites (Magnetic materials)
dc.keywordsStress
dc.keywordsEpoxy adhesives
dc.keywordsFinite element analysis
dc.keywordsFracture (Process)
dc.keywordsModeling
dc.keywordsTemperature
dc.keywordsCooling
dc.keywordsSilicones
dc.keywordsTension
dc.keywordsThermal expansion
dc.keywordsFailure
dc.keywordsThermal stresses
dc.keywordsElastic analysis
dc.keywordsCycles
dc.keywordsElectric potential AND Shrinkage (Materials)
dc.treeJournal of Electronic Packaging:;2009:;volume( 131 ):;issue: 001
dc.contenttypeFulltext


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