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dc.contributor.authorMohd F. Abdulhamid
dc.contributor.authorCemal Basaran
dc.date.accessioned2017-05-09T00:32:21Z
dc.date.available2017-05-09T00:32:21Z
dc.date.copyrightMarch, 2009
dc.date.issued2009
dc.identifier.issn1528-9044
dc.identifier.otherJEPAE4-26292#011002_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/140318
dc.description.abstractThermomigration experiments were conducted to study the change in mechanical properties of 95.5Sn–4Ag–0.5Cu (SAC405) lead-free solder joint under high temperature gradients. This paper presents some observations on samples that were subjected to 1000°C/cm thermal gradient (TG) for 286 h, 712 h, and 1156 h. It was observed that samples subjected to thermal gradient did not develop a Cu3Sn intermetallic compound (IMC) layer, and we observed disintegration of Cu6Sn5 IMC. On the other hand, samples subjected to isothermal annealing exhibited IMC growth. In samples subjected to thermomigration, near the cold side the Cu concentration is significantly higher compared with hot side. Extensive surface hardness testing showed an increase in hardness from the hot to cold sides, which possibly indicates that Sn grain coarsening is in the same direction.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleInfluence of Thermomigration on Lead-Free Solder Joint Mechanical Properties
dc.typeJournal Paper
dc.journal.volume131
dc.journal.issue1
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.3068296
dc.journal.fristpage11002
dc.identifier.eissn1043-7398
dc.treeJournal of Electronic Packaging:;2009:;volume( 131 ):;issue: 001
dc.contenttypeFulltext


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