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dc.contributor.authorPei-Hsuan Lee
dc.contributor.authorHsien-Cheng Tseng
dc.contributor.authorJung-Hua Chou
dc.date.accessioned2017-05-09T00:32:16Z
dc.date.available2017-05-09T00:32:16Z
dc.date.copyrightDecember, 2009
dc.date.issued2009
dc.identifier.issn1528-9044
dc.identifier.otherJEPAE4-26300#044501_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/140275
dc.description.abstractWe devise a finite-element model to analyze the thermal performance of collector-up (C-up) heterojunction bipolar transistors (HBTs) with a thermal-via configuration. A demonstration on the GaInP/GaAs C-up HBT is presented in this Brief, and the novelty of this work is that both 2D and 3D temperature-distribution analyses are performed. The 2D results indicate that the original thermal-via configuration can be reduced by 29%. Furthermore, the results show that the maximum temperature within the collector calculated from 3D analysis is lower than that from the 2D analysis. Based on the 3D analysis, it is revealed that the reported configuration can be reduced by 32%. Therefore, the C-up HBT with a compact thermal-via should be helpful for miniaturization of heat-dissipation packaging configurations within HBT-based high-power amplifiers.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleNovel Design of Thermal-Via Configurations for Collector-Up HBTs
dc.typeJournal Paper
dc.journal.volume131
dc.journal.issue4
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4000282
dc.journal.fristpage44501
dc.identifier.eissn1043-7398
dc.keywordsTemperature
dc.keywordsDesign
dc.keywordsGallium arsenide
dc.keywordsTemperature distribution
dc.keywordsPackaging
dc.keywordsHeat
dc.keywordsFinite element model
dc.keywordsThree-dimensional models
dc.keywordsTransistors AND Finite element analysis
dc.treeJournal of Electronic Packaging:;2009:;volume( 131 ):;issue: 004
dc.contenttypeFulltext


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