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dc.contributor.authorSheng Liu
dc.contributor.authorWenming Liu
dc.contributor.authorChangyong Lin
dc.contributor.authorMingxiang Chen
dc.date.accessioned2017-05-09T00:32:16Z
dc.date.available2017-05-09T00:32:16Z
dc.date.copyrightDecember, 2009
dc.date.issued2009
dc.identifier.issn1528-9044
dc.identifier.otherJEPAE4-26300#041010_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/140274
dc.description.abstractA novel ceramic packaging technology by using selective induction heating is presented. Some aspects of this packaging process, including local temperature distribution, hermeticity, tensile strength, and fracture analysis, were tested and evaluated. For high-frequency (f=350 kHz) induction heating, the temperature of cover edges near solder-loop reached up to 320°C in several seconds, hermetic seal of the ceramic package can be promised because of solder reflowing, while the temperature of the ceramic bottom was only about 100°C, so thermal-sensitive devices and integrated circuits inside the ceramic package can be protected from high-temperature damage. Temperature variation and distribution were evaluated by an infrared imager, and it agreed well with simulation results. Finally, tensile strength from 4.0 MPa to 13.0 MPa was achieved and the fracture interfaces were examined and analyzed depending on the induction heating time and packaging pressure.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleA Novel Ceramic Packaging Technique Using Selective Induction Heating
dc.typeJournal Paper
dc.journal.volume131
dc.journal.issue4
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4000366
dc.journal.fristpage41010
dc.identifier.eissn1043-7398
dc.keywordsElectromagnetic induction
dc.keywordsCeramics
dc.keywordsHeating
dc.keywordsPackaging
dc.keywordsTemperature AND Solders
dc.treeJournal of Electronic Packaging:;2009:;volume( 131 ):;issue: 004
dc.contenttypeFulltext


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