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dc.contributor.authorDavid M. Pierce
dc.contributor.authorArlo F. Fossum
dc.contributor.authorPaul T. Vianco
dc.contributor.authorSheri D. Sheppard
dc.contributor.authorMike K. Neilsen
dc.date.accessioned2017-05-09T00:27:37Z
dc.date.available2017-05-09T00:27:37Z
dc.date.copyrightMarch, 2008
dc.date.issued2008
dc.identifier.issn1528-9044
dc.identifier.otherJEPAE4-26283#011002_1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl/handle/yetl/137780
dc.description.abstractA unified creep plasticity damage (UCPD) constitutive model was developed to predict the fatigue of 95.5Sn–3.9Ag–0.6Cu solder joints. Compression, stress-strain and creep properties were generated in previous studies of this solder. Crack damage was reflected in a single state variable, Dω, in the model. Isothermal fatigue tests were performed at 25°C, 100°C, and 160°C using a double-lap shear test specimen. A new approach to fitting the revised damage model is proposed based on finite element analysis (FEA) simulation of the load decay of the fatigued solder material. Accurate predictions required that those parameters be temperature dependent. The UCPD constitutive model was successfully implemented as a subroutine in the commercial finite element code ANSYS ®. Consistent predictions were obtained as demonstrated by a comparison of results generated from FEA simulation of the test assembly against analogous experimental results.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleDevelopment of the Damage State Variable for a Unified Creep Plasticity Damage Constitutive Model of the 95.5Sn–3.9Ag–0.6Cu Lead-Free Solder
dc.typeJournal Paper
dc.journal.volume130
dc.journal.issue1
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.2837513
dc.journal.fristpage11002
dc.identifier.eissn1043-7398
dc.keywordsSimulation
dc.keywordsStress
dc.keywordsShear (Mechanics)
dc.keywordsConstitutive equations
dc.keywordsFinite element analysis
dc.keywordsTesting
dc.keywordsPlasticity
dc.keywordsCreep
dc.keywordsFatigue
dc.keywordsTemperature
dc.keywordsAlloys
dc.keywordsSolders
dc.keywordsSolder joints
dc.keywordsManufacturing
dc.keywordsFatigue testing
dc.keywordsLead-free solders AND Fittings
dc.treeJournal of Electronic Packaging:;2008:;volume( 130 ):;issue: 001
dc.contenttypeFulltext


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