• Login
    View Item 
    •   DSpace Home
    • ASME
    • Journal of Electronic Packaging
    • View Item
    •   DSpace Home
    • ASME
    • Journal of Electronic Packaging
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Thermal Conduction Switch for Thermal Management of Chip Scale Atomic Clocks (IMECE2006-14540)

    Thumbnail
    View/Open
    JEPAE4-26285#021011_1.pdf (616.6Kb)
    Date
    2008
    Author
    A. D. Laws
    Y. J. Chang
    V. M. Bright
    Y. C. Lee
    Metadata
    Show full item record
    Abstract
    We report the first use of a bimetallic buckling disk as a thermal conduction switch. The disk is used to passively alter the thermal resistance of the package of a chip scale atomic clock. A vertical-cavity surface-emitting laser and a cesium vapor cell, contained in the clock, must be maintained at 70±0.1°C even under an ambient temperature variation of −40°Cto50°C. A thermal test vehicle has been developed to characterize a sample package with a thermal conduction switch. Three cases are presented for the temperature control of the test vehicle under different load placements and environmental conditions: (1) a heating load with a good conduction path to the switch in a vacuum package; (2) the same loading as in Case 1, but packaged in air; and (3) a heating load insulated from the switch, in a vacuum package. At 38°C, the switch snaps upward to reduce the package’s thermal resistance. As a result, the heating power needed to maintain a constant temperature, 63.9±0.1°C, is increased from 118to200mW for Case 1. Such a significant change of the thermal resistance demonstrates the effectiveness of the thermal switch. However, the switch becomes less effective with air filling the gap, as in Case 2, and the switch is not effective at all if the heating load does not have a good conduction path to the switch as in Case 3. The steady state response of this novel thermal conduction switch has been well characterized through experimentation and finite element analysis.
    URI
    http://yetl.yabesh.ir/yetl/handle/yetl/137775
    Collections
    • Journal of Electronic Packaging

    DSpace software copyright © 2002-2015  DuraSpace
    Contact Us | Send Feedback
    Theme by 
    @mire NV
     

     

    Browse

    All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    LoginRegister

    Statistics

    View Usage Statistics

    DSpace software copyright © 2002-2015  DuraSpace
    Contact Us | Send Feedback
    Theme by 
    @mire NV